@article{oai:kumadai.repo.nii.ac.jp:00021382,
 author = {安仁屋, 勝 and 新川, 貴樹 and Shinkawa, Takaki and Aniya, Masaru and 新川, 貴樹 and Shinkawa, Takaki},
 issue = {Suppl. 1},
 journal = {Journal of Materials Science: Materials in Electronics},
 month = {Oct},
 note = {application/pdf, text/plain, 論文(Article), By analyzing the composition dependence of the total amount of Ag photodissolved into amorphous GexS1-x and the fragility of GexS1-x, it is found that at the composition where the amount of Ag photodissolved exhibits a maximum, the fragility shows a minimum, that is, there is an inverse correlation between these two quantities. The possible origin of the correlation found has been discussed by using the constraint theory and the model of fragility proposed by one of the authors., http://www.springer.com/materials/optical+&+electronic+materials/journal/10854},
 pages = {247--250},
 title = {A possible relationship between the composition dependence of Ag photodissolution and fragility in amorphous Ge-S},
 volume = {18},
 year = {2007},
 yomi = {シンカワ, タカキ and シンカワ, タカキ}
}