{"created":"2023-06-19T09:17:29.245777+00:00","id":30167,"links":{},"metadata":{"_buckets":{"deposit":"47fbabb4-f885-42f6-ab05-7df3a0dfd322"},"_deposit":{"created_by":1,"id":"30167","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"30167"},"status":"published"},"_oai":{"id":"oai:kumadai.repo.nii.ac.jp:00030167","sets":["448:449"]},"author_link":["139508","139509","139510","155700"],"item_16_biblio_info_6":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2014-12","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"10-12","bibliographicPageEnd":"1031","bibliographicPageStart":"1005","bibliographicVolumeNumber":"228","bibliographic_titles":[{"bibliographic_title":"Zeitschrift für Physikalische Chemie"}]}]},"item_16_creator_3":{"attribute_name":"別言語の著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Hosokawa, Shinya","creatorNameLang":"en"},{"creatorName":"細川, 伸也","creatorNameLang":"ja"},{"creatorName":"ホソカワ, シンヤ","creatorNameLang":"ja-Kana"}],"familyNames":[{"familyName":"Hosokawa","familyNameLang":"en"},{"familyName":"細川","familyNameLang":"ja"},{"familyName":"ホソカワ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Shinya","givenNameLang":"en"},{"givenName":"伸也","givenNameLang":"ja"},{"givenName":"シンヤ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"155700","nameIdentifierScheme":"WEKO"}]}]},"item_16_description_17":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_16_description_46":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"subitem_description":"論文(Article)","subitem_description_type":"Other"}]},"item_16_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Although X-ray diffraction is still mainly used to determine crystal structures, the demand for an understanding of the atomic arrangement in disordered matter has progressively become more important over the past decades. However, apart from simple model systems, it is still a challenging task to unravel the microscopic ordering of the atoms in amorphous multi-component materials, although this knowledge becomes increasingly important in modern materials science, in which the physical properties are often related to the microscopic ordering of the different chemical species of the substance. This article reports about the combination of Anomalous X-ray Scattering (AXS) with Reverse Monte Carlo Computer simulation (RMC) as a proper tool to precisely determine the microscopic structural characteristics in such systems with high reliability. The basic principles of the method will be illustrated and some examples of modern materials will be given to proof the applicability and the capability of this method.","subitem_description_type":"Other"}]},"item_16_description_77":{"attribute_name":"URL","attribute_value_mlt":[{"subitem_description":"https://www.degruyter.com/view/j/zpch.2014.228.issue-10-12/zpch-2014-0555/zpch-2014-0555.xml?format=INT","subitem_description_type":"Other"}]},"item_16_publisher_36":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"DE GRUYTER"}]},"item_16_relation_11":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1515/zpch-2014-0555","subitem_relation_type_select":"DOI"}}]},"item_16_rights_12":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 2011–2017 by Walter de Gruyter GmbH"}]},"item_16_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"09429352","subitem_source_identifier_type":"ISSN"}]},"item_16_subject_20":{"attribute_name":"日本十進分類法","attribute_value_mlt":[{"subitem_subject":"428.4","subitem_subject_scheme":"NDC"}]},"item_16_text_18":{"attribute_name":"形態","attribute_value_mlt":[{"subitem_text_value":"1864877 bytes"}]},"item_16_text_47":{"attribute_name":"資源タイプ・ローカル","attribute_value_mlt":[{"subitem_text_value":"雑誌掲載論文"}]},"item_16_text_48":{"attribute_name":"資源タイプ・NII","attribute_value_mlt":[{"subitem_text_value":"Journal Article"}]},"item_16_text_49":{"attribute_name":"資源タイプ・DCMI","attribute_value_mlt":[{"subitem_text_value":"text"}]},"item_16_text_50":{"attribute_name":"資源タイプ・ローカル表示コード","attribute_value_mlt":[{"subitem_text_value":"01"}]},"item_16_version_type_19":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Rüdiger Stellhorn, Jens"}],"nameIdentifiers":[{"nameIdentifier":"139508","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hosokawa, Shinya"}],"nameIdentifiers":[{"nameIdentifier":"139509","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Pilgrim, Wolf-Christian"}],"nameIdentifiers":[{"nameIdentifier":"139510","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-03-03"}],"displaytype":"detail","filename":"zpch228_1005-1031.pdf","filesize":[{"value":"1.9 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"zpch228_1005-1031.pdf","url":"https://kumadai.repo.nii.ac.jp/record/30167/files/zpch228_1005-1031.pdf"},"version_id":"eaf74ca8-98f2-4b4a-b6ac-7c4fd4500ac6"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Amorphous Materials","subitem_subject_scheme":"Other"},{"subitem_subject":"Glasses","subitem_subject_scheme":"Other"},{"subitem_subject":"X-ray Scattering","subitem_subject_scheme":"Other"},{"subitem_subject":"Anomalous Scattering","subitem_subject_scheme":"Other"},{"subitem_subject":"Microscopic Structure","subitem_subject_scheme":"Other"},{"subitem_subject":"Reverse Monte Carlo Simulation","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Microscopic Structure Analysis in Disordered Materials using Anomalous X-ray Scattering","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Microscopic Structure Analysis in Disordered Materials using Anomalous X-ray Scattering"}]},"item_type_id":"16","owner":"1","path":["449"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-09-21"},"publish_date":"2017-09-21","publish_status":"0","recid":"30167","relation_version_is_last":true,"title":["Microscopic Structure Analysis in Disordered Materials using Anomalous X-ray Scattering"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-08-18T02:29:05.404635+00:00"}